OptLab-SPX    Software for the determination of color data and optical
                     material parameters

The optical appearance of materials is of basic relevance for many applications. This can be the color of a transparent or opaque material, the blocking characteristics of protective glasses, or the sunlight transfer capability of window glasses. Generally an adequately recorded spectrum of the sample contains all information required. However, typically single values are generated from the spectrum in order to make an objective and verifiable decision. Therefore the spectral data are generally condensed by an appropriate convolution algorithm to single values. The OptLab-SPX software performs this type of calculation starting from a recorded spectrum. Generally the discussed calculations are derived from national and international standards like DIN, EN, ANSI, JIST, etc..

        OptLab-SPX main window

OptLab-SPX is compatible to most Thermo Scientific UV/Vis and Vis spectrometers and can be used as an additional module to the Thermo Scientific VISIONlite™ applications software for UV/Vis spectroscopy.
OptLab-SPX is also compatible to PerkinElmer UV/Vis and UV/Vis/NIR spectrometers of the Lambda series, see below.
As an offline package OptLab-SPX is able to import VISIONlite spectra, JCAMP spectra, UVWinLab 2.0-3.0 and UVWinLab >5.0 (ASCII format) as well as ASCII data tables including Microsoft Office Excel™ csv tables.

OptLab-SPX records/impots the required transmittance or reflectance sample spectrum and performs any required number of calculations. These can either be done automatically after spectrum recording or can be done off line with stored spectra. Generally the available calculations are derived from national and international norms and standards like DIN, ISO, ANSI, JIST, etc.:
-  UV-, NIR- and light transmittance coefficients acc. EN, ANSI, JIST etc.,
-  XYZ, xyY and Lab color values for different observers and illuminants acc. CIE/DIN/ASTM,
- Dominant/complimentary wavelength and excitation purity
CIE and CMC color difference calculations
-  Color inspection acc. European Pharmacopeia
-  Pt-Co/APHA/Hazen color values,
Gardner color values
Iodine color values
-  Whiteness and yellowness index acc. ASTM,
-  Coefficients for signal recognition acc. DIN (Q-factor) and British Rail,
-  UV- and NIR-protection coefficients,
-  Solar protection factor acc. COLIPA and AS/NZS,
-  Average spectrometric values and single values at specific wavelengths,
-  Check against high/low data and high/low reference spectra.
- Classification of results according to classification table.

A complete list of the OptLab-SPX parameters is given on the next page.

Calculation parameters are summarized as an OptLab-SPX method. The method determines the type of calculations, details of result output (like automatic printout or graph scaling) and the type of sample thickness transformation. An unlimited number of methods can be stored under selected names for easy usage in a routine environment.

Sample Thickness Transformation
To characterize transparent materials it may become necessary to generate results for a standard sample thickness. The sample thickness recalculation of an actual sample spectrum can be based on a single reflectance value, or on the material refractive index or on a full single-surface reflectance spectrum.

Color Inspection according to EP
One of the special features of OptLab-SPX is the option to perform color determinations according to the European Pharmacopeia. The procedure described in the EP has been transformed to an objective principle, which does no longer require the mixing and the measurement of reference solutions.

High/Low Comparisons
Besides the various integral parameters, OptLab-SPX as well allows to compare a sample spectrum to a table of minimum and maximum data or to given high/low reference spectra.

Configuring OptLab-SPX
Users can modify the list of available calculations; other calculations can be added, based on the available algorithms. It is also possible to change the naming of the predefined calculations.
OptLab-SPX also performs user definable calculations and logical decisions with data of the spectrum or several spectra. The user can be queried for variable entries. Thus standard spectrum evaluations can be additionally implemented.

Report Configuration with Reporter-SPX
The additional installation of the ascanis Reporter-SPX software allows to configure the report in many aspects, for example to define the spectrum diagram in size, color and appearance or to add additional texts and company logo, as well as calculations and decisions.

Compatible Spectrophotometers

communicates with most of the Thermo Scientific UV/Vis spectrophotometers:
  - GENESYS 30
  - GENESYS 40/140, 50/150, 180
  - Evolution 60 (S), Evolution 100, Evolution 160, Evolution 300
  - GENESYS 6, GENESYS 10 UV scanning
  - AquaMate, BioMate 3(S), BioMate 5, BioMate 6
  - GENESYS 10 S UV/Vis, GENESYS 10 S Vis
  - Evolution 201, Evolution 220, Evolution 260 Bio,
  - Spectronic 200.
Sipper, cell changer/positioner and Peltier thermostatting options are supported.

The software also communicates with the PerkinElmer Lambda 25 series UV/Vis spectrometers:
Lambda 25, Lambda 35 and Lambda 45. as well as the older types Lambda 2, Lambda 2S, Lambda 11, Lambda 12, Lambda 14, Lambda 10, Lambda 20, Lambda 40,
Sipper and cell changer options are supported.

A dedicated software version is available for the PerkinElmer Lambda 950 series of High Performance UV/Vis and UV/Vis/NIR spectrometers:
Lambda 650, Lambda 750, Lambda 800, Lambda 850, Lambda 900, Lambda 950 und Lambda 1050.
Also the recent models with USB control are supported.
With these models, also the URA (Universal Reflectance Accessory), the TAMS accessory and a cell changer are controlled.

The software can be installed as an additional module for the Thermo Scientific VISIONlite software versions > 2.0 and for the Lambda-SPX software.

OptLab-SPX system requirements: Windows® 7 / 8 (64 bit) / 8.1 (64 bit) / 10. A serial (RS-232) interface (or a USB port) is required for instrument control.